SN74BCT8240ADWR

SN74BCT8240ADWR
Mfr. #:
SN74BCT8240ADWR
描述:
Buffers & Line Drivers Device w/Octal Inverting Buffers
生命周期:
制造商新产品。
数据表:
SN74BCT8240ADWR 数据表
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ECAD Model:
更多信息:
SN74BCT8240ADWR 更多信息 SN74BCT8240ADWR Product Details
产品属性
属性值
制造商:
德州仪器
产品分类:
缓冲器和线路驱动器
RoHS:
Y
输入行数:
8 Input
输出线数:
8 Output
极性:
反转
电源电压 - 最大值:
5.5 V
电源电压 - 最小值:
4.5 V
最低工作温度:
0 C
最高工作温度:
+ 70 C
安装方式:
贴片/贴片
包装/案例:
SOIC-24 Wide
打包:
卷轴
功能:
扫描缓冲器/线路驱动器
高度:
2.35 mm
长度:
15.4 mm
输出类型:
3-State
静态电流:
35 mA
技术:
双CMOS
宽度:
7.52 mm
品牌:
德州仪器
逻辑系列:
BCT
逻辑类型:
边界扫描 (JTAG) 逻辑
通道数:
8
电源电流 - 最大值:
52000 uA
高电平输出电流:
- 15 mA
输入信号类型:
单端
低电平输出电流:
64 mA
工作电源电压:
4.5 V to 5.5 V
产品类别:
缓冲器和线路驱动器
传播延迟时间:
7.5 ns at 5 V
出厂包装数量:
1
子类别:
逻辑 IC
单位重量:
0.038731 oz
Tags
SN74BCT8240ADWR, SN74BCT8240AD, SN74BCT8240, SN74BCT82, SN74BCT8, SN74B, SN74, SN7
Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
Email us if you have excess stock to sell.

Email: [email protected]

Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
***i-Key
IC SCAN TEST DEVICE BUFF 24-SOIC
***as Instruments
The 'BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F240 and 'BCT240 octal buffers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal buffers. In the test mode, the normal operation of the SCOPETM octal buffers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations, as described in IEEE Standard 1149.1-1990. Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54BCT8240A is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74BCT8240A is characterized for operation from 0°C to 70°C.
型号 描述 库存 价格
SN74BCT8240ADWR
DISTI # SN74BCT8240ADWR-ND
IC SCAN TEST DEVICE BUFF 24-SOIC
RoHS: Compliant
Min Qty: 2000
Container: Tape & Reel (TR)
Limited Supply - Call
    SN74BCT8240ADWRE4
    DISTI # SN74BCT8240ADWRE4-ND
    IC SCAN TEST DEVICE BUFF 24-SOIC
    RoHS: Compliant
    Min Qty: 2000
    Container: Tape & Reel (TR)
    Limited Supply - Call
      SN74BCT8240ADWRG4
      DISTI # SN74BCT8240ADWRG4-ND
      IC SCAN TEST DEVICE 24SOIC
      RoHS: Compliant
      Min Qty: 2000
      Container: Tape & Reel (TR)
      Limited Supply - Call
        SN74BCT8240ADWR
        DISTI # 595-SN74BCT8240ADWR
        Buffers & Line Drivers Device w/Octal Inverting Buffers
        RoHS: Compliant
        0
          SN74BCT8240ADWRE4
          DISTI # 595-SN74BCT8240ADWRE
          Specialty Function Logic Prog PCM w/Microphn Amps & Speaker Drvr
          RoHS: Compliant
          0
            SN74BCT8240ADWRG4
            DISTI # 595-74BCT8240ADWRG4
            Specialty Function Logic IEEE Std 1149.1 Bndry Sacn Tst Devic
            RoHS: Compliant
            0
              SN74BCT8240ADWRBoundary Scan Bus Driver, BCT/FBT Series, 2-Func, 4-Bit, Inverted Output, BICMOS, PDSO24
              RoHS: Compliant
              30000
              • 1000:$6.7600
              • 500:$7.1200
              • 100:$7.4100
              • 25:$7.7300
              • 1:$8.3200
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              Mfr.#: SN74BCT8245ADW

              OMO.#: OMO-SN74BCT8245ADW-TEXAS-INSTRUMENTS

              Specialty Function Logic IEEE 1149.1
              可用性
              库存:
              Available
              订购:
              5500
              输入数量:
              SN74BCT8240ADWR的当前价格仅供参考,如果您想获得最优惠的价格,请提交查询或直接发送电子邮件至我们的销售团队[email protected]
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