SN74BCT8240ANT

SN74BCT8240ANT
Mfr. #:
SN74BCT8240ANT
描述:
Buffers & Line Drivers Device w/Octal Inverting Buffers
生命周期:
制造商新产品。
数据表:
SN74BCT8240ANT 数据表
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ECAD Model:
更多信息:
SN74BCT8240ANT 更多信息 SN74BCT8240ANT Product Details
产品属性
属性值
制造商:
德州仪器
产品分类:
缓冲器和线路驱动器
RoHS:
Y
输入行数:
8 Input
输出线数:
8 Output
极性:
反转
电源电压 - 最大值:
5.5 V
电源电压 - 最小值:
4.5 V
最低工作温度:
0 C
最高工作温度:
+ 70 C
安装方式:
通孔
包装/案例:
PDIP-24
打包:
管子
功能:
扫描缓冲器/线路驱动器
高度:
4.57 mm
长度:
31.64 mm
输出类型:
3-State
静态电流:
35 mA
技术:
双CMOS
宽度:
6.73 mm
品牌:
德州仪器
逻辑系列:
BCT
逻辑类型:
边界扫描 (JTAG) 逻辑
通道数:
8
电源电流 - 最大值:
52000 uA
高电平输出电流:
- 15 mA
输入信号类型:
单端
低电平输出电流:
64 mA
工作电源电压:
5 V
产品类别:
缓冲器和线路驱动器
传播延迟时间:
7.5 ns at 5 V
出厂包装数量:
1
子类别:
逻辑 IC
单位重量:
0.131925 oz
Tags
SN74BCT8240, SN74BCT82, SN74BCT8, SN74B, SN74, SN7
Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
Email us if you have excess stock to sell.

Email: [email protected]

Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
***i-Key
IC SCAN TEST DEVICE BUFF 24-DIP
***ark
Specialty Logic IC; Logic Family:BCT; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Package/Case:24-PDIP; No. of Pins:24; Operating Temperature Range:0°C to +70°C; Input Type:TTL; Leaded Process Compatible:Yes; Output Type:TTL ;RoHS Compliant: Yes
***as Instruments
The 'BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F240 and 'BCT240 octal buffers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal buffers. In the test mode, the normal operation of the SCOPETM octal buffers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations, as described in IEEE Standard 1149.1-1990. Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54BCT8240A is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74BCT8240A is characterized for operation from 0°C to 70°C.
型号 描述 库存 价格
SN74BCT8240ANT
DISTI # SN74BCT8240ANT-ND
IC SCAN TEST DEVICE BUFF 24-DIP
RoHS: Compliant
Min Qty: 60
Container: Tube
Limited Supply - Call
    SN74BCT8240ANTG4
    DISTI # SN74BCT8240ANTG4-ND
    IC SCAN TEST DEVICE BUFF 24-DIP
    RoHS: Compliant
    Min Qty: 60
    Container: Tube
    Limited Supply - Call
      SN74BCT8240ANT
      DISTI # 595-SN74BCT8240ANT
      Buffers & Line Drivers Device w/Octal Inverting Buffers
      RoHS: Compliant
      0
        SN74BCT8240ANTE4
        DISTI # 595-SN74BCT8240ANTE4
        Specialty Function Logic Device w/Octal Inverting Buffers
        RoHS: Compliant
        0
          SN74BCT8240ANTBoundary Scan Bus Driver, BCT/FBT Series, 2-Func, 4-Bit, Inverted Output, BICMOS, PDIP24
          RoHS: Compliant
          1404
          • 1000:$6.7600
          • 500:$7.1200
          • 100:$7.4100
          • 25:$7.7300
          • 1:$8.3200
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          IC SCAN TEST DEVICE BUFF 24-SOIC
          可用性
          库存:
          Available
          订购:
          3000
          输入数量:
          SN74BCT8240ANT的当前价格仅供参考,如果您想获得最优惠的价格,请提交查询或直接发送电子邮件至我们的销售团队[email protected]
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