SN74ABT18640DLRG4

Mfr. #:: SN74ABT18640DLRG4
描述:: Specialty Function Logic Device w/18-Bit Inv Bus Transceiver
生命周期:: 制造商新产品。
数据表:: SN74ABT18640DLRG4 数据表
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更多信息:: SN74ABT18640DLRG4 更多信息 SN74ABT18640DLRG4 Product Details

产品属性
属性值

制造商：: 德州仪器

产品分类：: 专业功能逻辑

RoHS：: Y

产品：: 边界扫描 JTAG 逻辑

系列：: 74AB

工作电源电压：: 4.5 V to 5.5 V

包装/案例：: SSOP-56

打包：: 卷轴

品牌：: 德州仪器

安装方式：: 贴片/贴片

产品类别：: 专业功能逻辑

出厂包装数量：: 1

子类别：: 逻辑 IC

单位重量：: 0.024508 oz

Tags: SN74ABT18640DL, SN74ABT18640, SN74ABT1864, SN74ABT186, SN74ABT18, SN74ABT1, SN74AB, SN74A, SN74, SN7

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We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
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Step1:
Vacuum Packaging with PL

Step2:
Anti-Static Bag

Step3:
Packaging Boxes

SN74ABT18640DLRG4 描述

***i-Key: IC SCAN TEST DEVICE 18BIT 56SSOP

***as Instruments: The 'ABT18640 scan test devices with 18-bit inverting bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are 18-bit inverting bus transceivers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM bus transceivers. Data flow is controlled by the direction-control (DIR) and output-enable () inputs. Data transmission is allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. can be used to disable the device so that the buses are effectively isolated. In the test mode, the normal operation of the SCOPETM bus transceivers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990. Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN74ABT18640 is available in TI's shrink small-outline (DL) and thin shrink small-outline (DGG) packages, which provide twice the I/O pin count and functionality of standard small-outline packages in the same printed-circuit-board area. The SN54ABT18640 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABT18640 is characterized for operation from -40°C to 85°C.

Market price

型号	描述	库存	价格
SN74ABT18640DLRG4 DISTI # SN74ABT18640DLRG4-ND	IC SCAN TEST DEVICE 18BIT 56SSOP RoHS: Compliant Min Qty: 1000 Container: Tape & Reel (TR)	Limited Supply - Call
SN74ABT18640DLRG4 DISTI # 595-SN74ABT18640DLRG	Specialty Function Logic Device w/18-Bit Inv Bus Transceiver RoHS: Compliant	0

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