SN74LVT8980AIDWREP

SN74LVT8980AIDWREP
Mfr. #:
SN74LVT8980AIDWREP
描述:
Specialty Function Logic Mil Enhance Embedded Test-Bus Cntrlr
生命周期:
制造商新产品。
数据表:
SN74LVT8980AIDWREP 数据表
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ECAD Model:
更多信息:
SN74LVT8980AIDWREP 更多信息 SN74LVT8980AIDWREP Product Details
产品属性
属性值
制造商:
德州仪器
产品分类:
专业功能逻辑
RoHS:
Y
系列:
SN74LVT8980A-EP
最低工作温度:
- 40 C
最高工作温度:
+ 85 C
包装/案例:
SOIC-24
打包:
卷轴
工作温度范围:
- 40 C to + 85 C
品牌:
德州仪器
安装方式:
贴片/贴片
产品类别:
专业功能逻辑
出厂包装数量:
2000
子类别:
逻辑 IC
第 # 部分别名:
V62/03668-01XE
单位重量:
0.022025 oz
Tags
SN74LVT8980A, SN74LVT8980, SN74LVT898, SN74LVT8, SN74LVT, SN74LV, SN74L, SN74, SN7
Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
Email us if you have excess stock to sell.

Email: [email protected]

Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
***as Instruments
Enhanced Product Embedded Test-Bus Controllers Ieee Std 1149.1 (Jtag) Tap Masters 24-SOIC -40 to 85
***ical
Bus Controller Parallel/Serial Interface 24-Pin SOIC T/R
***ark
IC,Test/JTAG Support,LVT/ALVT-BICMOS,SOP,24PIN,PLASTIC
***i-Key
IC EMBEDDED TEST BUS CTRL 24SOIC
*** Stop Electro
Microprocessor Circuit, BICMOS, PDSO24
***et
EP - JTAG EMBEDDED TEST-BUS CONTROLLER
***i-Key Marketplace
SN74LVT8980A-EP ENHANCED PRODUCT
***AS INSTUMENTS
The SN74LVT8980A embedded test-bus controllers (eTBCs) are members of the TI broad family of testability integrated circuits. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit assemblies. Unlike most other devices of this family, the eTBCs are not boundary-scannable devices; rather, their function is to master an IEEE Std 1149.1 (JTAG) test access port (TAP) under the command of an embedded host microprocessor/microcontroller. Thus, the eTBCs enable the practical and effective use of the IEEE Std 1149.1 test-access infrastructure to support embedded/built-in test, emulation, and configuration/maintenance facilities at board and system levels.
***INS
The eTBCs master all TAP signals required to support one 4- or 5-wire IEEE Std 1149.1 serial test bus: test clock (TCK), test mode select (TMS), test data input (TDI), test data output (TDO), and test reset (TRST)\. All such signals can be connected directly to the associated target IEEE Std 1149.1 devices without need for additional logic or buffering. However, as well as being directly connected, the TMS, TDI, and TDO signals can be connected to distant target IEEE Std 1149.1 devices via a pipeline, with a retiming delay of up to 15 TCK cycles; the eTBCs automatically handle all associated serial-data justification.
***AS INST
Conceptually, the eTBCs operate as simple 8-bit memory- or I/O-mapped peripherals to a microprocessor/microcontroller (host). High-level commands and parallel data are passed to/from the eTBCs via their generic host interface, which includes an 8-bit data bus (D7-D0) and a 3-bit address bus (A2-A0). Read/write select (R/W\) and strobe (STRB)\ signals are implemented so that the critical host-interface timing is independent of the CLKIN period. An asynchronous ready (RDY) indicator is provided to hold off, or insert wait states into, a host read/write cycle when the eTBCs cannot respond immediately to the requested read/write operation.
***TEXAS
High-level commands are issued by the host to cause the eTBCs to generate the TMS sequences necessary to move the test bus from any stable TAP-controller state to any other such stable state, to scan instruction or data through test registers in target devices, and/or to execute instructions in the Run-Test/Idle TAP state. A 32-bit counter can be programmed to allow a predetermined number of scan or execute cycles.
***AS INS
During scan operations, serial data that appears at the TDI input is transferred into a serial to 4 × 8-bit-parallel first-in/first-out (FIFO) read buffer, which can then be read by the host to obtain the return serial-data stream up to eight bits at a time. Serial data that is to be transmitted from the TDO output is written by the host, up to eight bits at a time, to a 4 × 8-bit-parallel to serial FIFO write buffer.
***OMO Electronic
In addition to such simple state-movement, scan, and run-test operations, the eTBCs support several additional commands that provide for input-only scans, output-only scans, recirculate scans (in which TDI is mirrored back to TDO), and a scan mode that generates the protocols used to support multidrop TAP configurations using TI’s addressable scan port. Two loopback modes also are supported that allow the microprocessor/microcontroller host to monitor the TDO or TMS data streams output by the eTBCs.
***ASI
The eTBCs’ flexible clocking architecture allows the user to choose between free-running (in which the TCK always follows CLKIN) and gated modes (in which the TCK output is held static except during state-move, run-test, or scan cycles) as well as to divide down TCK from CLKIN. A discrete mode also is available in which the TAP is driven strictly by read/write cycles under full control of the microprocessor/microcontroller host. These features ensure that virtually any IEEE Std 1149.1 target device or device chain can be serviced by the eTBCs, even where such may not fully comply to IEEE Std 1149.1.
***AS INSTRUMENTS INCORPORATED
While most operations of the eTBCs are synchronous to CLKIN, a test-output enable (TOE)\ is provided for output control of the TAP outputs, and a reset (RST)\ input is provided for hardware reset of the eTBCs. The former can be used to disable the eTBCs so that an external controller can master the associated IEEE Std 1149.1 test bus.
Logic Solutions
OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More
型号 描述 库存 价格
SN74LVT8980AIDWREP
DISTI # 296-22384-1-ND
IC EMBEDDED TEST BUS CTRL 24SOIC
RoHS: Compliant
Min Qty: 1
Container: Cut Tape (CT)
1711In Stock
  • 1000:$8.9728
  • 500:$9.7824
  • 100:$10.9968
  • 10:$13.0210
  • 1:$14.1700
SN74LVT8980AIDWREP
DISTI # 296-22384-6-ND
IC EMBEDDED TEST BUS CTRL 24SOIC
RoHS: Compliant
Min Qty: 1
Container: Digi-Reel®
1711In Stock
  • 1000:$8.9728
  • 500:$9.7824
  • 100:$10.9968
  • 10:$13.0210
  • 1:$14.1700
SN74LVT8980AIDWREP
DISTI # 296-22384-2-ND
IC EMBEDDED TEST BUS CTRL 24SOIC
RoHS: Compliant
Min Qty: 2000
Container: Tape & Reel (TR)
Temporarily Out of Stock
  • 2000:$8.3840
SN74LVT8980AIDWREP
DISTI # SN74LVT8980AIDWREP
Embedded Test Bus Controller 24-Pin SOIC T/R - Tape and Reel (Alt: SN74LVT8980AIDWREP)
RoHS: Compliant
Min Qty: 2000
Container: Reel
Americas - 0
  • 2000:$9.4900
  • 4000:$8.9900
  • 8000:$8.6900
  • 12000:$8.3900
  • 20000:$8.1900
SN74LVT8980AIDWREP
DISTI # SN74LVT8980AIDWREP
Embedded Test Bus Controller 24-Pin SOIC T/R (Alt: SN74LVT8980AIDWREP)
RoHS: Compliant
Min Qty: 2000
Container: Tape and Reel
Europe - 0
  • 2000:€10.3900
  • 4000:€9.3900
  • 8000:€8.4900
  • 12000:€8.1900
  • 20000:€7.7900
SN74LVT8980AIDWREPEnhanced Product Embedded Test-Bus Controllers Ieee Std 1149.1 (Jtag) Tap Masters4000
  • 1000:$7.4400
  • 750:$7.4700
  • 500:$8.3200
  • 250:$9.0400
  • 100:$9.5000
  • 25:$10.8700
  • 10:$11.2700
  • 1:$12.1200
SN74LVT8980AIDWREP
DISTI # 595-SN74L8980AIDWREP
Specialty Function Logic Mil Enhance Embedded Test-Bus Cntrlr
RoHS: Compliant
0
  • 2000:$8.7200
V62/03668-01XE
DISTI # 595-V62/03668-01XE
Specialty Function Logic Mil Enhance Embedded Test-Bus Cntrlr
RoHS: Compliant
0
    SN74LVT8980AIDWREPMicroprocessor Circuit, BICMOS, PDSO24
    RoHS: Compliant
    1765
    • 1000:$8.6200
    • 500:$9.0700
    • 100:$9.4500
    • 25:$9.8500
    • 1:$10.6100
    图片 型号 描述
    SN74LVT8996DW

    Mfr.#: SN74LVT8996DW

    OMO.#: OMO-SN74LVT8996DW

    Specialty Function Logic 3.3V 10-Bit Add Port Multi-Add Tap Trncvr
    SN74LVT8986PM

    Mfr.#: SN74LVT8986PM

    OMO.#: OMO-SN74LVT8986PM

    Specialty Function Logic 3.3V Link Add Port Multi-Add Tap Trncvr
    SN74LVT8980ADWRG4

    Mfr.#: SN74LVT8980ADWRG4

    OMO.#: OMO-SN74LVT8980ADWRG4-TEXAS-INSTRUMENTS

    IC TEST-BUS CONTROLLER 24-SOIC
    SN74LVT8996DWR

    Mfr.#: SN74LVT8996DWR

    OMO.#: OMO-SN74LVT8996DWR-TEXAS-INSTRUMENTS

    Specialty Function Logic 3.3V 10-Bit Add Port Multi-Add Tap Trncv
    SN74LVT8980AIDWREP

    Mfr.#: SN74LVT8980AIDWREP

    OMO.#: OMO-SN74LVT8980AIDWREP-TEXAS-INSTRUMENTS

    Specialty Function Logic Mil Enhance Embedded Test-Bus Cntrl
    SN74LVT8986PM

    Mfr.#: SN74LVT8986PM

    OMO.#: OMO-SN74LVT8986PM-TEXAS-INSTRUMENTS

    Specialty Function Logic 3.3V Link Add Port Multi-Add Tap Trncv
    SN74LVT8996PW

    Mfr.#: SN74LVT8996PW

    OMO.#: OMO-SN74LVT8996PW-TEXAS-INSTRUMENTS

    Specialty Function Logic 3.3V 10-Bit Add Port Multi-Add Tap Trncv
    SN74LVT8980DW

    Mfr.#: SN74LVT8980DW

    OMO.#: OMO-SN74LVT8980DW-1190

    Embedded Test Bus Controller 24-Pin SOIC (Alt: SN74LVT8980DW)
    SN74LVT8996PW(LX8996)

    Mfr.#: SN74LVT8996PW(LX8996)

    OMO.#: OMO-SN74LVT8996PW-LX8996--1190

    全新原装
    SN74LVT8996PWRG4

    Mfr.#: SN74LVT8996PWRG4

    OMO.#: OMO-SN74LVT8996PWRG4-1190

    全新原装
    可用性
    库存:
    Available
    订购:
    1000
    输入数量:
    SN74LVT8980AIDWREP的当前价格仅供参考,如果您想获得最优惠的价格,请提交查询或直接发送电子邮件至我们的销售团队[email protected]
    参考价格(美元)
    数量
    单价
    小计金额
    1
    US$13.75
    US$13.75
    10
    US$12.64
    US$126.40
    25
    US$11.99
    US$299.75
    100
    US$10.68
    US$1 068.00
    250
    US$10.16
    US$2 540.00
    500
    US$9.50
    US$4 750.00
    1000
    US$8.72
    US$8 720.00
    由于2021年半导体供不应求,低于2021年之前的正常价格,请发询价确认。
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